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Volumn 225, Issue 3, 2004, Pages 217-230

Classical dynamics simulation of the fluence dependence of sputtering properties for the 2 keV Cu → Cu(1 0 0) system

Author keywords

Computer simulation; Sputtering

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; COPPER; MONOLAYERS; PROJECTILES; SPUTTERING; STATISTICS; SURFACE PHENOMENA;

EID: 4344674710     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.04.172     Document Type: Article
Times cited : (4)

References (61)
  • 49
    • 0004123702 scopus 로고    scopus 로고
    • J.C. Vickerman, & D. Briggs. Chichester: Surface Spectra and IM Publications
    • Wucher A. Vickerman J.C., Briggs D. ToF-SIMS: Surface Analysis by Mass Spectrometry. 2001;Surface Spectra and IM Publications, Chichester.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry
    • Wucher, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.