Step edge selection during ion erosion of Cu(001)

Physical Review Letters

Volumn 89, Issue 14, 2002, Pages 146102/1-146102/4

  Broekmann, Peter ^a   Mewe, Agnes ^a   Wormeester, Herbert ^a   Poelsema, Bene ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMS; COMPUTER SIMULATION; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; ION BOMBARDMENT; LOW ENERGY ELECTRON DIFFRACTION; MONTE CARLO METHODS; MORPHOLOGY; POSITIVE IONS; SPUTTERING; THERMODYNAMIC STABILITY;

INTERLAYER MASS TRANSPORT; ION EROSION; ION SPUTTERING; STEP EDGE SELECTION;

COPPER;

EID: 0037201726     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.146102     Document Type: Article

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