Real-time detection of linear and angular displacements with a modified DVD optical head

Nanotechnology

Volumn 19, Issue 11, 2008, Pages

  Hwu, En Te ^a   Hung, Shao Kang ^a   Yang, Chih Wen ^a   Huang, Kuang Yuh ^b   Hwang, Ing Shouh ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; GRAPHITE; REAL TIME CONTROL; VIDEODISKS;

ANGULAR DISPLACEMENTS; GRAPHITE SURFACES; MECHANICAL RESONANCE; OPTICAL HEADS;

ABERRATIONS;

ARTICLE; ATOMIC FORCE MICROSCOPY; NANOSENSOR; OPTICS; PRIORITY JOURNAL; SURFACE PROPERTY; SYSTEM ANALYSIS; VIBRATION;

EID: 42549091095     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/11/115501     Document Type: Article

References (30)

1. Binnig G, Quate C F and Gerber Ch 1986 Phys. Rev. Lett. 56 930
2. Wiesendanger R 1994 Scanning Probe Microscopy and Spectroscopy (Cambridge: Cambridge University Press)
3. Fritz J et al 2000 Science 288 316
4. Lavrik N V, Sepaniak M J and Datskos P G 2004 Rev. Sci. Instrum. 75 2229
5. Ilic B et al 2000 Appl. Phys. Lett. 77 450
6. Li M, Tang H X and Roukes M L 2007 Nat. Nanotechnol. 2 114
7. Burg T P et al 2007 Nature 446 1066
8. den Boef A J 1989 Appl. Phys. Lett. 55 439
9. Hoogenboom B H et al 2005 Appl. Phys. Lett. 86 074101
10. Göddenhenrich T, Lemke H, Hartmann U and Heiden C 1990 J. Vac. Sci. Technol. A 8 383
11. Meyer G and Amer N M 1988 Appl. Phys. Lett. 53 1045
12. Compann K and Kramer P 1973 Philips Tech. Rev. 33 178
13. Bouwhuis G and Braat J J M 1978 Appl. Opt. 17 1993
14. Cohen D K, Gee W H, Ludeke M and Lewkowicz J 1984 Appl. Opt. 23 565
15. Masud M 1987 Appl. Opt. 26 3981
16. Zhang J and Cai L 1996 IEEE. Instrumentation and Measurement Technology Conf. (Belgium, June) p 513
17. Fan K C, Lin C Y and Shyu L H 2000 Meas. Sci. Technol. 11 N1
18. Quercioli F, Tiribilli B, Ascoli C, Baschieri P and Frediani C 1999 Rev. Sci. Instrum. 70 3620
19. Hu E T, Huang K Y and Hwang I S 2004 Proc. Optics East USA vol 5602 p 218
20. Cooper E B et al 2000 Appl. Phys. Lett. 76 3316
21. Taguchi A, Miyoshi T, Takaya Y and Takahashi S 2004 Precis. Eng. 28 152
22. Hwu E T, Huang K Y, Hung S K and Hwang I S 2005 Japan. J. Appl. Phys. 45 2368
23. Fukuma T et al 2005 Rev. Sci. Instrum. 76 053704
24. Sturm J et al 2005 IEEE J. Solid-State Circuits 40 1406
25. Deger C et al 1998 Appl. Phys. Lett. 72 2400
26. Knuuttila J V, Tikka P T and Salomaa M M 2000 Opt. Lett. 25 613
27. Hung S K, Hwang I S and Fu L C 2004 Proc. IMTC Italy vol 3 p 1985
28. Kohno T, Ozawa N, Miyamoto K and Musha T 1988 Appl. Opt. 27 103
29. Ehrmann K, Ho A and Schindheim K 1998 Meas. Sci. Technol. 9 1259
30. Chu C L and Lin C H 2005 Meas. Sci. Technol. 16 2498