Scanning Michelson interferometer for imaging surface acoustic wave fields

Optics Letters

Volumn 25, Issue 9, 2000, Pages 613-615

  Knuuttila, J V ^a   Tikka, P T ^a,b   Salomaa, M M ^a  

^a AALTO UNIVERSITY   (Finland)

^b NMP Inc   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

MICHELSON INTERFEROMETERS;

ACOUSTIC SURFACE WAVE DEVICES; INTERFEROMETERS; LIGHT MODULATION; OPTICAL WAVEGUIDES;

IMAGING TECHNIQUES;

EID: 0001736550     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.25.000613     Document Type: Article

References (18)

1. C. C. W. Ruppel, W. Ruile, G. Scholl, K. Ch. Wagner, and O. Männer, in Proceedings of the 1994 IEEE Ultrasonics Symposium (Institute of Electrical and Electronics Engineers, New York, 1995), p. 313.
2. C. S. Hartmann and V. P. Plessky, in Proceedings of the 1993 IEEE Ultrasonics Symposium (Institute of Electrical and Electronics Engineers, New York, 1994), p. 1247.
3. T. Hesjedal, E. Chilla, and H.-J. Fröhlich, Appl. Phys. Lett. 70, 1372 (1997).
4. G. Behme, T. Hesjedal, E. Chilla, and H.-J. Fröhlich, Appl. Phys. Lett. 73, 882 (1998).
5. S. Jen and C. S. Hartmann, in Proceedings of the 1996 IEEE Ultrasonics Symposium (Institute of Electrical and Electronics Engineers, New York, 1997), p. 33.
6. G. Sölkner, A. Ginter, and H.-P. Grassl, Mater. Sci. Eng. A 122, 43 (1989).
7. A. Ginter and G. Sölkner, Appl. Phys. Lett. 53, 2295 (1990).
8. A. Holm, P. Wallner, W. Ruile, and R. Weigel, in Proceedings of the 1997 IEEE Ultrasonics Symposium (Institute of Electrical and Electronics Engineers, New York, 1998), p. 153.
9. J. V. Knuuttila, P. T. Tikka, C. S. Hartmann, V. P. Plessky, and M. M. Salomaa, Electron. Lett. 35, 1115 (1999).
10. J. Koskela, J. V. Knuuttila, P. T. Tikka, C. S. Hartmann, V. P. Plessky, and M. M. Salomaa, Appl. Phys. Lett. 75, 2683 (1999).
11. P. T. Tikka, J. Kaitila, M. Ylilammi, J. V. Knuuttila, T. Makkonen, K. Hashimoto, and M. M. Salomaa, in Proceedings of the 1998 IEEE Ultrasonics Symposium (Institute of Electrical and Electronics Engineers, New York, 1998), p. 1143.
12. A. Royer and E. Dieulesaint, in Proceedings of the 1986 IEEE Ultrasonics Symposium (Institute of Electrical and Electronics Engineers, New York, 1986), p. 527.
13. R. L. Jungerman, J. E. Bowers, J. B. Green, and G. S. Kino, Appl. Phys. Lett. 40, 313 (1982).
14. J. E. Bowers, R. L. Jungerman, B. T. Khuri-Yakub, and G. S. Kino, J. Lightwave Technol. 1, 429 (1983).
15. Y. C. Shen and P. Hess, J. Appl. Phys. 82, 4758 (1997).
16. H. Sontag and A. C. Tam, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 33, 500 (1986).
17. C. B. Scruby and L. E. Drain, Laser Ultrasonics (Hilger, London, 1990).
18. V. P. Plessky, RF Design 21, 46 (1998).