Monitoring of an atomic force microscope cantilever with a compact disk pickup

Review of Scientific Instruments

Volumn 70, Issue 9, 1999, Pages 3620-3624

  Quercioli, F ^a   Tiribilli, B ^a   Ascoli, C ^b   Baschieri, P ^b   Frediani, C ^b  

^a ISTITUTO NAZIONALE DI OTTICA   (Italy)

^b CNR Consiglio Nazionale delle Ricerche   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008579924     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149969     Document Type: Article

References (14)

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