메뉴 건너뛰기




Volumn 42, Issue 2, 2008, Pages 251-259

Numerical modelling of impact rupture in polysilicon microsystems

Author keywords

Fracture simulation; Impact rupture; Micro electro mechanical systems (MEMS); Numerical simulation

Indexed keywords

ANISOTROPY; FINITE ELEMENT METHOD; MEMS; MICROSYSTEMS; NUMERICAL METHODS; POLYCRYSTALS; TWO DIMENSIONAL;

EID: 42449087759     PISSN: 01787675     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00466-007-0231-5     Document Type: Article
Times cited : (24)

References (33)
  • 1
    • 36849104521 scopus 로고
    • Calculated elastic constants for stress problems associated with semiconductor devices
    • Brantley WA (1973) Calculated elastic constants for stress problems associated with semiconductor devices. J Appl Phys 44: 534-535
    • (1973) J Appl Phys , vol.44 , pp. 534-535
    • Brantley, W.A.1
  • 2
    • 24144436225 scopus 로고    scopus 로고
    • Out of plane vs. in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach
    • Cacchione F, Corigliano A, De Masi B, Riva C (2005) Out of plane vs. in plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach. Microelect Reliab 45: 1758-1763
    • (2005) Microelect Reliab , vol.45 , pp. 1758-1763
    • Cacchione, F.1    Corigliano, A.2    De Masi, B.3    Riva, C.4
  • 3
    • 33846018897 scopus 로고    scopus 로고
    • Rupture tests on polysilicon films through on-chip electrostatic actuation
    • Cacchione F, De Masi B, Corigliano A, Ferrera M (2006) Rupture tests on polysilicon films through on-chip electrostatic actuation. Sens Lett 4: 38-45
    • (2006) Sens Lett , vol.4 , pp. 38-45
    • Cacchione, F.1    De Masi, B.2    Corigliano, A.3    Ferrera, M.4
  • 4
    • 0030212427 scopus 로고    scopus 로고
    • Computational modelling of impact damage in brittle materials
    • Camacho GT, Ortiz M (1996) Computational modelling of impact damage in brittle materials. Int J Solids Struct 33: 2899-2938
    • (1996) Int J Solids Struct , vol.33 , pp. 2899-2938
    • Camacho, G.T.1    Ortiz, M.2
  • 5
    • 33748437824 scopus 로고    scopus 로고
    • Fracture toughness and subcritical crack growth in polycristalline silicon
    • Chasiotis I, Cho SW, Jonnalagadda K (2006) Fracture toughness and subcritical crack growth in polycristalline silicon. J Appl Mech 73: 714-722
    • (2006) J Appl Mech , vol.73 , pp. 714-722
    • Chasiotis, I.1    Cho, S.W.2    Jonnalagadda, K.3
  • 6
    • 33846285316 scopus 로고    scopus 로고
    • Elastic properties and representative volume element of polycristalline silicon for MEMS
    • Cho SW, Chasiotis I (2007) Elastic properties and representative volume element of polycristalline silicon for MEMS. Exp Mech 47: 37-49
    • (2007) Exp Mech , vol.47 , pp. 37-49
    • Cho, S.W.1    Chasiotis, I.2
  • 8
    • 0027790383 scopus 로고
    • Formulation, identification and use of interface elements in the numerical analysis of composite delamination
    • Corigliano A (1993) Formulation, identification and use of interface elements in the numerical analysis of composite delamination. Int J Solids Struct 30: 2779-2811
    • (1993) Int J Solids Struct , vol.30 , pp. 2779-2811
    • Corigliano, A.1
  • 9
    • 29144507364 scopus 로고    scopus 로고
    • On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale
    • Corigliano A, Cacchione F, De Masi B, Riva C (2005) On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale. Meccanica 40: 485-503
    • (2005) Meccanica , vol.40 , pp. 485-503
    • Corigliano, A.1    Cacchione, F.2    De Masi, B.3    Riva, C.4
  • 11
    • 84908308118 scopus 로고    scopus 로고
    • Micro-scale simulation of impact rupture in polysilicon Mems
    • Alexandropoulos, 3-7 July, on CD
    • Corigliano A, Cacchione F, Frangi A, Zerbini S (2006) Micro-scale simulation of impact rupture in polysilicon Mems. Proceedings: ECF16, Alexandropoulos, 3-7 July, on CD
    • (2006) Proceedings: ECF16
    • Corigliano, A.1    Cacchione, F.2    Frangi, A.3    Zerbini, S.4
  • 12
    • 1942468578 scopus 로고    scopus 로고
    • Mechanical characterization of polysilicon through on chip tensile tests
    • 2
    • Corigliano A, De Masi B, Frangi A, Comi C (2004) Mechanical characterization of polysilicon through on chip tensile tests. J Microelectromech Syst 13(2): 200-219
    • (2004) J Microelectromech Syst , vol.13 , pp. 200-219
    • Corigliano, A.1    De Masi, B.2    Frangi, A.3    Comi, C.4
  • 13
    • 3042702985 scopus 로고    scopus 로고
    • On chip tensile test for epitaxial polysilicon
    • Maastricht. Technical digest 25-29 January
    • De Masi B, Villa A, Corigliano A, Frangi A, Comi C, Marchi M (2004) On chip tensile test for epitaxial polysilicon. In: Proceedings: MEMS04, Maastricht. Technical digest, pp 129-132, 25-29 January
    • (2004) Proceedings: MEMS04 , pp. 129-132
    • De Masi, B.1    Villa, A.2    Corigliano, A.3    Frangi, A.4    Comi, C.5    Marchi, M.6
  • 14
    • 0037342388 scopus 로고    scopus 로고
    • A grain level model for the study of failure initiation and evolution in polycristalline brittle materials. Part I: Theory and numerical implementation
    • Espinosa HD, Zavattieri PD (2003) A grain level model for the study of failure initiation and evolution in polycristalline brittle materials. Part I: theory and numerical implementation. Mech Mater 35: 333-364
    • (2003) Mech Mater , vol.35 , pp. 333-364
    • Espinosa, H.D.1    Zavattieri, P.D.2
  • 15
    • 0037343110 scopus 로고    scopus 로고
    • A grain level model for the study of failure initiation and evolution in polycrystalline brittle materials. Part II: Numerical examples
    • Espinosa HD, Zavattieri PD (2003) A grain level model for the study of failure initiation and evolution in polycrystalline brittle materials. Part II: numerical examples. Mech Mater 35: 365-394
    • (2003) Mech Mater , vol.35 , pp. 365-394
    • Espinosa, H.D.1    Zavattieri, P.D.2
  • 17
    • 0031223366 scopus 로고    scopus 로고
    • Tessellation-based computational methods for the characterization and analysis of heterogeneous microstructures
    • Ghosh S, Nowak Z, Lee K (1997) Tessellation-based computational methods for the characterization and analysis of heterogeneous microstructures. Compos Sci Technol 57: 1187-1210
    • (1997) Compos Sci Technol , vol.57 , pp. 1187-1210
    • Ghosh, S.1    Nowak, Z.2    Lee, K.3
  • 18
    • 0029292832 scopus 로고
    • Voronoi cell finite element model based on micropolar theory of thermoelasticity for heterogeneous materials
    • Ghosh S, Yunshan L (1995) Voronoi cell finite element model based on micropolar theory of thermoelasticity for heterogeneous materials. Int J Numer Methods Eng 38: 1361-1368
    • (1995) Int J Numer Methods Eng , vol.38 , pp. 1361-1368
    • Ghosh, S.1    Yunshan, L.2
  • 19
    • 10444258917 scopus 로고    scopus 로고
    • Free drop test simulation for portable IC package by implicit transient dynamics FEM
    • Irving S, Liu Y (2004) Free drop test simulation for portable IC package by implicit transient dynamics FEM. Proc IEEE Electron Compon Technol Conf 1062-1066
    • (2004) Proc IEEE Electron Compon Technol Conf , pp. 1062-1066
    • Irving, S.1    Liu, Y.2
  • 21
    • 0034250366 scopus 로고    scopus 로고
    • Drop test and analysis on micro machined structures
    • Li GX, Shemansky FA Jr (2000) Drop test and analysis on micro machined structures. Sens Actuat 85: 280-286
    • (2000) Sens Actuat , vol.85 , pp. 280-286
    • Li, G.X.1    Shemansky Jr, F.A.2
  • 22
    • 33751072632 scopus 로고    scopus 로고
    • Multiple cohesive crack growth in brittle materials by the extended Voronoi cell finite element model
    • Li S, Ghosh S (2006) Multiple cohesive crack growth in brittle materials by the extended Voronoi cell finite element model. Int J Fract 141: 373-393
    • (2006) Int J Fract , vol.141 , pp. 373-393
    • Li, S.1    Ghosh, S.2
  • 23
    • 32444450815 scopus 로고    scopus 로고
    • Extended Voronoi celle finite element model for multiple cohesive crack propagation in brittle materials
    • Li S, Ghosh S (2006) Extended Voronoi celle finite element model for multiple cohesive crack propagation in brittle materials. Int J Numer Meth Eng 65: 1028-1067
    • (2006) Int J Numer Meth Eng , vol.65 , pp. 1028-1067
    • Li, S.1    Ghosh, S.2
  • 24
    • 0036767961 scopus 로고    scopus 로고
    • Numerical simulation of the drop impact response of a portable electronic product
    • Lim CT, Teo YM, Shim VPW (2002) Numerical simulation of the drop impact response of a portable electronic product. IEEE Trans Compon Packag Technol 25: 478-485
    • (2002) IEEE Trans Compon Packag Technol , vol.25 , pp. 478-485
    • Lim, C.T.1    Teo, Y.M.2    Shim, V.P.W.3
  • 27
    • 0141460811 scopus 로고    scopus 로고
    • Extended finite element method for quasi-brittle fracture
    • Mariani S, Perego U (2003) Extended finite element method for quasi-brittle fracture. Int J Numer Methods Eng 58: 103-126
    • (2003) Int J Numer Methods Eng , vol.58 , pp. 103-126
    • Mariani, S.1    Perego, U.2
  • 28
    • 0031170260 scopus 로고    scopus 로고
    • Monte Carlo simulation of effective elastic constants of polycrystalline thin films
    • Mullen RL, Ballarini R, Yin L, Heue AH (1997) Monte Carlo simulation of effective elastic constants of polycrystalline thin films. Acta Mater 45: 2247-2255
    • (1997) Acta Mater , vol.45 , pp. 2247-2255
    • Mullen, R.L.1    Ballarini, R.2    Yin, L.3    Heue, A.H.4
  • 29
    • 0029369354 scopus 로고
    • Adaptive dynamic relaxation algorithm for non-linear hyperelastic structures. Part i Formulation
    • Oakley DR, Knight NF Jr (1995) Adaptive dynamic relaxation algorithm for non-linear hyperelastic structures. Part I Formulation. Compos Methods Appl Mech Eng 126: 67-89
    • (1995) Compos Methods Appl Mech Eng , vol.126 , pp. 67-89
    • Oakley, D.R.1    Knight Jr, N.F.2
  • 32
    • 0036601266 scopus 로고    scopus 로고
    • The reliability of microelectromechanical systems (MEMS) in shock environments
    • 3
    • Srikar VT, Senturia SD (2002) The reliability of microelectromechanical systems (MEMS) in shock environments. J Microelectromech Syst 11(3): 206-214
    • (2002) J Microelectromech Syst , vol.11 , pp. 206-214
    • Srikar, V.T.1    Senturia, S.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.