Analysis of Schottky barriers to ultrathin strained Si

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Connelly, Daniel ^a   Clifton, Paul ^a  

^a Acorn Technologies   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; SCHRODINGER EQUATION; SILICON; ULTRATHIN FILMS;

DEFORMATION POTENTIAL PARAMETER SETS; STRAINED ULTRATHIN SILICON;

SCHOTTKY BARRIER DIODES;

EID: 42149169054     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2902384     Document Type: Article

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