메뉴 건너뛰기




Volumn 91, Issue 2, 2008, Pages 267-271

Formation of coherent Ge shallow dome islands on Si(001) by ultra-high-vacuum ion beam sputter deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LATTICE MISMATCH; SILICON; SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

EID: 40949110482     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-4384-z     Document Type: Article
Times cited : (12)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.