Direct measurement of strain in a Ge island on Si(001)

Applied Physics Letters

Volumn 75, Issue 1, 1999, Pages 46-48

  Miller, Peter D ^a   Liu, Chuan Pu ^a   Henstrom, William L ^a   Gibson, J Murray ^a   Huang, Y ^b   Zhang, P ^b   Kamins, T I ^c   Basile, D P ^c   Williams, R Stanley ^c  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b University of Illinois at Urbana Champaign   (United States)

^c HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003313658     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124272     Document Type: Article

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