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Volumn 83, Issue 8, 1998, Pages 4472-4476

Ion assisted growth and characterization of polycrystalline silicon and silicon-germanium films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0242332370     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367209     Document Type: Article
Times cited : (18)

References (14)
  • 13
    • 0347804935 scopus 로고
    • Card 5-565 and 17-901 Joint Committee on Powder Diffraction Standards
    • L. G. Berry, Powder Diffraction File, Card 5-565 and 17-901 (Joint Committee on Powder Diffraction Standards, 1974).
    • (1974) Powder Diffraction File
    • Berry, L.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.