Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis

Review of Scientific Instruments

Volumn 79, Issue 1, 2008, Pages

  Maess, Johannes ^a   Fleming, Andrew J ^b   Allgöwer, Frank ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MICROSCOPES; SCANNING PROBE MICROSCOPY; SOFTWARE PACKAGES;

DYNAMICS COUPLING EFFECTS; PIEZOELECTRIC TUBE SCANNERS; QUADRANT ELECTRODES;

PIEZOELECTRIC DEVICES;

EID: 38849153476     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2826428     Document Type: Article

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