Letter to the editor: Image formation in the high-resolution transmission electron microscope

Microscopy and Microanalysis

Volumn 10, Issue 4, 2004, Pages 397-400

  O'Keefe, Michael A ^a   Diebold, A C ^b   Foran, B ^b   Kisielowski, C ^c   Muller, D A ^d   Pennycook, S J ^e   Principe, E ^b   Stemmer, S ^f  

^a Materials Sciences Division   (United States)

^b International SEMATECH ^*

^c Natl Center for Electron Microscopy   (United States)

^d NOKIA RESEARCH CENTER   (United States)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

^f UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; NOTE;

IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON;

EID: 19644398045     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604041054     Document Type: Letter

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