Design and performance of an ultra-high-resolution 300 kV microscope

Ultramicroscopy

Volumn 64, Issue 1-4, 1996, Pages 17-34

  Bakker, Hans ^a   Bleeker, Arno ^a   Mul, Peter ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRON OPTICS; ELECTROSTATIC LENSES; HOLOGRAPHY; PRISMS;

ULTRA-HIGH RESOLUTION;

ELECTRON MICROSCOPES;

ARTICLE; ELECTRON MICROSCOPY; HOLOGRAPHY;

EID: 0030221712     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00026-5     Document Type: Article

References (13)

1. [1] D. van Dyck and M. OpdeBeeck, in: Proc. 12th Int. Congr. on Electron Microscopy, Seattle (1990), p. 26.
2. [2] H. Lichte, Ultramicroscopy 47 (1992) 223.
3. [3] D. van Dyck and A.F. de Jong, Ultramicroscopy 47 (1992) 266.
4. [4] A.F. de Jong and D. van Dyck, Ultramicroscopy 49 (1993) 66.
5. [5] I. Daberkow, K.-H. Hermann, Libin Liu and W.D. Rau, Ultramicroscopy 38 (1991) 215.
6. [6] H. Tietz, in: Proc. 10th Eur. Congr. on Electron Microscopy, Granada, Spain (1992), Vol. 1, p. 131.
7. [7] H. Lichte, in: Advances in Optical and Electron Microssopy, Vol. 12 (Academic Press, New York, 1991) p. 25.
8. [8] L.W. Swanson, in: Proc. MSA (MAS, 1994) p. 938.
9. [9] J.R.A. Cleaver, Optik 57 (1980) 9.
10. [10] D.C. Joy, Ultramicroscopy 51 (1993) 1.
11. [11] H. Lichte, Ultramicroscopy 52 (1993) 575.
12. [12] W.M.J. Coene and T.J.J. Denteneer, Ultramicroscopy 38 (1991) 225.
13. [13] O.L. Krivanek, Ultramicroscopy 55 (1994) 419.