Physical Limits on Atomic Resolution

Microscopy and Microanalysis

Volumn 10, Issue 1, 2004, Pages 153-157

  Van Dyck, D ^a   Van Aert, S ^b   Den Dekker, A J ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Amorphous structure; Atomic resolution; Electron tomography; Precision parameter estimation; Transmission electron microscope

Indexed keywords

SILICON;

CHEMISTRY; CONFERENCE PAPER; CRYSTALLIZATION; ELECTRON; ELECTRON MICROSCOPY; METHODOLOGY; TOMOGRAPHY;

CRYSTALLIZATION; ELECTRONS; MICROSCOPY, ELECTRON; SILICON; TOMOGRAPHY;

EID: 1442289756     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760404036X     Document Type: Conference Paper

References (5)

1. DEN DEKKER, A.J. & VAN DEN BOS, A. (1997). Resolution: A survey. J Opt Soc Am A 14, 547-557.
2. ROSE, A. (1948). Television pickup tubes and the problem of vision. In Advances in Electronics and Electron Physics, Marton, L. (Ed.), pp. 131-166. New York: Academic Press.
3. VAN DEN BOS, A. & DEN DEKKER, A.J. (2001). Resolution reconsidered - Conventional approaches and an alternative. Adv Imag Electron Phys 117, 241-360.
4. VAN DYCK, D. & OP DE BEECK, M. (1996). A simple intuitive theory for electron diffraction. Ultramicroscopy 64, 99-107.
5. VAN DYCK, D., VAN AERT, S., DEN DEKKER, A.J. & VAN DEN BOS, A. (2003). Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Ultramicroscopy 98, 27-42.