Atomic resolution three-dimensional electron diffraction microscopy

Physical Review Letters

Volumn 89, Issue 15, 2002, Pages 155502/1-155502/4

  Miao, Jianwei ^a   Ohsuna, Tetsu ^b   Terasaki, Osamu ^c   Hodgson, Keith O ^a,d   O’Keefe, Michael A ^e  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b TOHOKU UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d STANFORD UNIVERSITY   (United States)

^e LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ALGORITHMS; APPROXIMATION THEORY; COMPUTER SIMULATION; CRYSTAL STRUCTURE; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON GUNS; ELECTRON SCATTERING; FOURIER TRANSFORMS; NANOSTRUCTURED MATERIALS; THREE DIMENSIONAL;

ELECTRON LENS ABERRATION; NANOCRYSTAL; OVERSAMPLING PHASING METHOD; THREE DIMENSIONAL ELECTRON DIFFRACTION MICROSCOPY;

ELECTRON MICROSCOPY;

EID: 0037037902     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.155502     Document Type: Article

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