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Volumn 4, Issue , 1998, Pages 382-383

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AT ZERO Cs

Author keywords

[No Author keywords available]

Indexed keywords


EID: 22444456241     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600022030     Document Type: Article
Times cited : (4)

References (8)
  • 3
    • 0002170585 scopus 로고
    • Phys. M.A. O'Keefe, Ultramicroscopy 47 (1992) 282-297
    • O. Scherzer, J. Appl. Phys. 20 (1949) 20-29. M.A. O'Keefe, Ultramicroscopy 47 (1992) 282-297.
    • (1949) , vol.20 , pp. 20-29
    • Scherzer, O.1    Appl, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.