Optical studies of InN epilayers on Si substrates with different buffer layers

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Yang, M D ^a   Shen, J L ^a   Chen, M C ^b   Chiang, C C ^b   Lan, S M ^b   Yang, T N ^b   Lo, M H ^c   Kuo, H C ^c   Lu, T C ^c   Huang, P J ^a   Hung, S C ^a   Chi, G C ^a   Chou, W C ^c  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^b INSTITUTE OF NUCLEAR ENERGY RESEARCH   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; INDIUM COMPOUNDS; LATTICE MISMATCH; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SILICON; X RAY DIFFRACTION;

EMISSION-ENERGY DEPENDENCE; LOCALIZATION ENERGY;

EPILAYERS;

EID: 37149053776     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817826     Document Type: Article

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