Raman spectroscopy of wurtzite InN films grown on Si

Solid State Communications

Volumn 115, Issue 1, 2000, Pages 19-21

  Agullo Rueda F ^a   Mendez, E E ^b   Bojarczuk, B ^c   Guha, S ^c  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b STONY BROOK UNIVERSITY   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; FILM GROWTH; MOLECULAR BEAM EPITAXY; PHONONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS;

INDIUM NITRIDE; INELASTIC LIGHT SCATTERING; WURTZITE STRUCTURE;

SEMICONDUCTING FILMS;

EID: 0343777412     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00132-0     Document Type: Article

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