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Volumn 7, Issue 11, 2007, Pages 3399-3404

Integration of individual nanoscale structures into devices using dynamic nanostenciling

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; NONDESTRUCTIVE EXAMINATION; SUPRAMOLECULAR CHEMISTRY; SYNTHESIS (CHEMICAL); VACUUM APPLICATIONS;

EID: 36749055724     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl071778m     Document Type: Article
Times cited : (23)

References (36)
  • 6
    • 36749058669 scopus 로고    scopus 로고
    • E-Beam Nanolithography Integrated with Scanning Electron Microscope
    • Zhou, W, Wang, Z. L, Eds, Springer: Berlin
    • Nabity, J.; Campbell, L. A.; Zhu, M.; Zhou, W. E-Beam Nanolithography Integrated with Scanning Electron Microscope. In Scanning Microscopy for Nanotechnology; Zhou, W., Wang, Z. L., Eds.; Springer: Berlin, 2007; pp 120-151.
    • (2007) Scanning Microscopy for Nanotechnology , pp. 120-151
    • Nabity, J.1    Campbell, L.A.2    Zhu, M.3    Zhou, W.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.