-
1
-
-
0000031946
-
-
C. Joachim, J. K. Gimzewski, R. R. Schlittler, and C. Chavy, Phys. Rev. Lett. 74, 2102 (1995).
-
(1995)
Phys. Rev. Lett.
, vol.74
, pp. 2102
-
-
Joachim, C.1
Gimzewski, J.K.2
Schlittler, R.R.3
Chavy, C.4
-
2
-
-
0037192991
-
-
J. Reichert, R. Ochs, D. Beckmann, H. Weber, M. Mayor, and H. V. Löhneysen, Phys. Rev. Lett. 88, 176804 (2002).
-
(2002)
Phys. Rev. Lett.
, vol.88
, pp. 176804
-
-
Reichert, J.1
Ochs, R.2
Beckmann, D.3
Weber, H.4
Mayor, M.5
Löhneysen, H.V.6
-
3
-
-
33746623397
-
-
X. Lin, X. He, T. Yang, W. Guo, D. Shi, H. Gao, D. Ma, S. Lee, F. Liu, and X. Xie, Appl. Phys. Lett. 89, 043103 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 043103
-
-
Lin, X.1
He, X.2
Yang, T.3
Guo, W.4
Shi, D.5
Gao, H.6
Ma, D.7
Lee, S.8
Liu, F.9
Xie, X.10
-
5
-
-
0842287335
-
-
D. R. Stewart, D. A. A. Ohlberg, P. A. Beck, Y. Chen, R. S. Williams, J. O. Jeppesen, K. A. Nielsen, and J. F. Stoddart, Nano Lett. 4, 133 (2004).
-
(2004)
Nano Lett.
, vol.4
, pp. 133
-
-
Stewart, D.R.1
Ohlberg, D.A.A.2
Beck, P.A.3
Chen, Y.4
Williams, R.S.5
Jeppesen, J.O.6
Nielsen, K.A.7
Stoddart, J.F.8
-
6
-
-
0036801994
-
-
M. S. M. Saifullah, T. Ondarcuhu, D. K. Koltsov, C. Joachim, and M. E. Welland, Nanotechnology 13, 659 (2002).
-
(2002)
Nanotechnology
, vol.13
, pp. 659
-
-
Saifullah, M.S.M.1
Ondarcuhu, T.2
Koltsov, D.K.3
Joachim, C.4
Welland, M.E.5
-
7
-
-
0032606877
-
-
M. M. Deshmukh, D. C. Ralph, M. Thomas, and J. Silcox, Appl. Phys. Lett. 75, 1631 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1631
-
-
Deshmukh, M.M.1
Ralph, D.C.2
Thomas, M.3
Silcox, J.4
-
8
-
-
13244279809
-
-
M. A. F. van den Boogaart, G. M. Kim, R. Pellens, J. P. van den Heuvel, and J. Brugger, J. Vac. Sci. Technol. B 22, 3174 (2004).
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 3174
-
-
Van Den Boogaart, M.A.F.1
Kim, G.M.2
Pellens, R.3
Van Den Heuvel, J.P.4
Brugger, J.5
-
9
-
-
12944295089
-
-
S. Egger, A. Llie, T. Fu, J. Chongsathien, D. Kang, and M. E. Welland, Nano Lett. 5, 15 (2005).
-
(2005)
Nano Lett.
, vol.5
, pp. 15
-
-
Egger, S.1
Llie, A.2
Fu, T.3
Chongsathien, J.4
Kang, D.5
Welland, M.E.6
-
10
-
-
13744259389
-
-
P. Zahl, M. Bammerlin, G. Meyer, and R. R. Schlittler, Rev. Sci. Instrum. 76, 023707 (2005).
-
(2005)
Rev. Sci. Instrum.
, vol.76
, pp. 023707
-
-
Zahl, P.1
Bammerlin, M.2
Meyer, G.3
Schlittler, R.R.4
-
12
-
-
0038768201
-
-
R. Lüthi, R. R. Schittler, J. Brugger, P. Vettiger, M. E. Welland, and J. K. Gimzewski, Appl. Phys. Lett. 75, 1314 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1314
-
-
Lüthi, R.1
Schittler, R.R.2
Brugger, J.3
Vettiger, P.4
Welland, M.E.5
Gimzewski, J.K.6
-
13
-
-
33847628927
-
-
H. Guo, D. Martrou, M. J. Polesel-Maris, M. A. Venegas, T. Zambelli, E. Dujardin, L. Guiraud, and S. Gauthier, (unpublished).
-
-
-
Guo, H.1
Martrou, D.2
Polesel-Maris, M.J.3
Venegas, M.A.4
Zambelli, T.5
Dujardin, E.6
Guiraud, L.7
Gauthier, S.8
-
14
-
-
0000682617
-
-
T. Ondaŗuhu, L. Nicu, S. Cholet, C. Bergaud, S. Gerdes, and C. Joachim, Rev. Sci. Instrum. 71, 2087 (2000).
-
(2000)
Rev. Sci. Instrum.
, vol.71
, pp. 2087
-
-
Ondaŗuhu, T.1
Nicu, L.2
Cholet, S.3
Bergaud, C.4
Gerdes, S.5
Joachim, C.6
-
15
-
-
33847679772
-
-
Zeiss 1540 ExB Crossbeam FIB-FEGSEM, fitted with a Ga source and operated at 30 kV.
-
Zeiss 1540 ExB Crossbeam FIB-FEGSEM, fitted with a Ga source and operated at 30 kV.
-
-
-
-
16
-
-
33847657652
-
-
OMCL-RC800PB from Olympus Corporation. These tips are hollow, with about 800 nm thick walls. Nominal resonance frequency=66 kHz, nominal stiffness=0.82 Nm.
-
OMCL-RC800PB from Olympus Corporation. These tips are hollow, with about 800 nm thick walls. Nominal resonance frequency=66 kHz, nominal stiffness=0.82 Nm.
-
-
-
-
17
-
-
0012827729
-
-
M. Kolbel, R. W. Tjerkstra, J. Brugger, C. J. M. van Rijn, W. Nijdam, J. Huskens, and D. N. Reinhoudt, Nano Lett. 2, 1339 (2002).
-
(2002)
Nano Lett.
, vol.2
, pp. 1339
-
-
Kolbel, M.1
Tjerkstra, R.W.2
Brugger, J.3
Van Rijn, C.J.M.4
Nijdam, W.5
Huskens, J.6
Reinhoudt, D.N.7
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