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Volumn 90, Issue 9, 2007, Pages

Nanostenciling for fabrication and interconnection of nanopatterns and microelectrodes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; IMAGING SYSTEMS; LITHOGRAPHY; SILICON NITRIDE; ULTRAHIGH VACUUM;

EID: 33847616903     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710473     Document Type: Article
Times cited : (20)

References (17)
  • 15
    • 33847679772 scopus 로고    scopus 로고
    • Zeiss 1540 ExB Crossbeam FIB-FEGSEM, fitted with a Ga source and operated at 30 kV.
    • Zeiss 1540 ExB Crossbeam FIB-FEGSEM, fitted with a Ga source and operated at 30 kV.
  • 16
    • 33847657652 scopus 로고    scopus 로고
    • OMCL-RC800PB from Olympus Corporation. These tips are hollow, with about 800 nm thick walls. Nominal resonance frequency=66 kHz, nominal stiffness=0.82 Nm.
    • OMCL-RC800PB from Olympus Corporation. These tips are hollow, with about 800 nm thick walls. Nominal resonance frequency=66 kHz, nominal stiffness=0.82 Nm.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.