Structural and electrical characterization of carbon nanofibers for interconnect via applications

IEEE Transactions on Nanotechnology

Volumn 6, Issue 6, 2007, Pages 688-695

  Ngo, Quoc ^b,c   Yamada, Toshishige ^b   Suzuki, Makoto ^b   Ominami, Yusuke ^b   Cassell, Alan M ^c   Li, Jun ^c,d   Meyyappan, M ^a,c   Yang, Cary Y ^a,b  

^a IEEE

^b Santa Clara University   (United States)

^c NASA AMES RESEARCH CENTER   (United States)

^d KANSAS STATE UNIVERSITY   (United States)

Author keywords

Carbon nanofiber; Interconnects; Via

Indexed keywords

ELECTRICAL RELIABILITY MEASUREMENTS; HOPPING ELECTRON CONDUCTION; ON-CHIP INTERCONNECT; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

CATALYSTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; NANOSTRUCTURED MATERIALS;

CARBON NANOFIBERS;

EID: 36349003661     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2007.907400     Document Type: Article

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