Four-probe charge transport measurements on individual vertically aligned carbon nanofibers

Applied Physics Letters

Volumn 84, Issue 20, 2004, Pages 3972-3974

  Zhang, Lan ^a,c   Austin, Derek ^a,d   Merkulov, Vladimir I ^a   Meleshko, Anatoli V ^a,c   Klein, Kate L ^a,c   Guillorn, Michael A ^b   Lowndes, Douglas H ^a   Simpson, Michael L ^a,c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

^c UNIVERSITY OF TENNESSEE   (United States)

^d University of Tennessee Knoxville   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSPORT MEASUREMENTS; ELECTRONIC INTERCONNECTS; JUNCTION EFFECTS; VERTICALLY ALIGNED CARBON NANOFIBERS (VACNF);

CARBON; ELECTRIC CHARGE; ELECTRIC VARIABLES MEASUREMENT; ELECTRON BEAM LITHOGRAPHY; FIBERS; GOLD; GRAPHITE; OHMIC CONTACTS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PLASMA ETCHING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; TITANIUM;

NANOSTRUCTURED MATERIALS;

EID: 2942589286     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1748849     Document Type: Article

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