SCOPUS 정보 검색 플랫폼

Volumn 106, Issue 7, 2006, Pages 597-602

Bottom-up sample preparation technique for interfacial characterization of vertically aligned carbon nanofibers

(8) Ominami, Yusuke a Ngo, Quoc a,c Kobayashi, Nobuhiko P a Mcilwrath, Kevin b Jarausch, Konrad b Cassell, Alan M c Li, Jun c Yang, Cary Y a

a Santa Clara University (United States)

b Hitachi High Technologies America (United States)

c NASA AMES RESEARCH CENTER (United States)

Author keywords

Carbon nanofiber; Focused ion beam (FIB); Interconnect; Sample preparation; Scanning transmission electron microscopy (STEM)

Indexed keywords

INTERFACES (MATERIALS); ION BEAMS; NANOSTRUCTURED MATERIALS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOFIBER; FOCUSED ION BEAM (FIB); INTERCONNECT; NANOSTRUCTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

CARBON FIBERS;

CARBON FIBER; NANOTUBE;

ARTICLE; CHEMICAL STRUCTURE; ROENTGEN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; VAPORIZATION;

EID: 33646785413 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2006.03.001 Document Type: Article

Times cited : (8)

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