La0.7Sr0.3MnO3 thin films on Bi4Ti3O12/CeO2/yttria-stabilised-zirconia buffered Si(0 0 1) substrates: Electrical, magnetic and 1/f noise properties

Materials Science and Engineering: B

Volumn 144, Issue 1-3, 2007, Pages 73-77

  Mechin L ^a   Perna, P ^a,b   Barone, C ^a,c   Routoure, J M ^a   Simon, Ch ^d  

^a UNIVERSITÉ DE CAEN   (France)

^b UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^c UNIVERSITY OF SALERNO   (Italy)

^d LABORATOIRE CRISMAT   (France)

Author keywords

Buffer layers; Epitaxial growth; Manganites; Oxide; Silicon

Indexed keywords

BISMUTH COMPOUNDS; BUFFER LAYERS; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; LANTHANUM COMPOUNDS; MAGNETIC PROPERTIES; MANGANITES; SILICON; X RAY DIFFRACTION; YTTRIA STABILIZED ZIRCONIA;

EPITAXIAL QUALITY; NOISE PROPERTIES;

EPITAXIAL FILMS;

EID: 35748932651     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.07.067     Document Type: Article

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