Epitaxial La0.7 Sr0.3 Mn O3 thin films with two in-plane orientations on silicon substrates with yttria-stabilized zirconia and Y Ba2 Cu3 O7-δ as buffer layers

Journal of Applied Physics

Volumn 97, Issue 7, 2005, Pages

  Goh, Wei Chuan ^a   Yao, Kui ^b   Ong, C K ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; SILICON SUBSTRATES; TWO IN-PLANE ORIENTATIONS; YTTRIA-STABILIZED ZIRCONIA (YSZ);

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELECTRON SCATTERING; EPITAXIAL GROWTH; GRAIN BOUNDARIES; MAGNETORESISTANCE; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICON; THIN FILMS; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS; ZIRCONIA;

LANTHANUM COMPOUNDS;

EID: 17444410323     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1876577     Document Type: Article

References (11)

1. S. Jin, M. McCormack, T. H. Tiefel, and R. Ramesh, J. Appl. Phys. 76, 6929 (1994).
2. K. Derbyshire and E. Korczynski, Solid State Technol. 38, 57 (1995).
3. A. Lisauskas, S. I. Khartsev, and A. Grishin, Appl. Phys. Lett. 77, 756 (2000).
4. J. Li, C. K. Ong, Q. Zhan, and D. X. Li, J. Phys.: Condens. Matter 14, 6341 (2002).
5. Z. Tranjanovic, Appl. Phys. Lett. 69, 1005 (1996).
6. J. Y. Gu, Appl. Phys. Lett. 70, 1763 (1997).
7. J.-H. Kim, S. I. Khartsev, and A. M. Grishin, Appl. Phys. Lett. 82, 4295 (2003).
8. J. Y. Gu, Appl. Phys. Lett. 72, 1113 (1998).
9. S. J. Wang, S. Y. Xu, L. P. You, S. L. Lim, and C. K. Ong, Supercond. Sci. Technol. 13, 362 (2000).
10. S. M. Garrison, N. Newman, B. F. Cole, K. Char, and R. W. Barton, Appl. Phys. Lett. 58, 2168 (1991).
11. A. Gupta, Phys. Rev. B 54, 015629 (1996).