Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous silicon thin films

Journal of Physics D: Applied Physics

Volumn 40, Issue 21, 2007, Pages 6677-6683

  Gomes S ^a   David, L ^a   Lysenko, V ^b   Descamps, A ^a   Nychyporuk, T ^b   Raynaud, M ^a  

^a UNIVERSITÉ DE LYON   (France)

^b INSTITUT DES NANOTECHNOLOGIES DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

INSULATING MATERIALS; MICROMETERS; MONOLAYERS; POROSITY; POROUS SILICON; RAMAN SPECTROSCOPY; THERMAL CONDUCTIVITY;

FILM POROSITIES; MESO POROUS SILICON THIN FILMS; MONOCRYSTALLINE SILICON SUBSTRATE; SCANNING THERMAL MICROSCOPE (STHM);

THIN FILMS;

EID: 35548942368     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/21/029     Document Type: Article

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