SCOPUS 정보 검색 플랫폼

EPJ Applied Physics

Volumn 35, Issue 1, 2006, Pages 17-27

CuO thin films thermal conductivity and interfacial thermal resistance estimation

(5) Kusiak, A a Battaglia, J L a Gomez, S b Manaud, J P b Lepetitcorps, Y b

a ARTS ET MÉTIERS PARISTECH (France)

b INST CHIM MATIERE COND BORDEAUX (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDES; HEAT RESISTANCE; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; THERMAL CONDUCTIVITY; THERMODYNAMIC PROPERTIES; TUNGSTEN CARBIDE;

CONTACT RESISTANCE; INFRARED MEASUREMENT; PHOTOTHERMAL METHOD; THERMAL PERTURBATION;

THIN FILMS;

EID: 33746872932 PISSN: 12860042 EISSN: 12860050 Source Type: Journal
DOI: 10.1051/epjap:2006064 Document Type: Article

Times cited : (13)

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