Evaluation of the thermal conductivity of porous silicon layers by an optical pump-probe method

Journal of Physics Condensed Matter

Volumn 13, Issue 5, 2001, Pages 1141-1150

  Bernini, U ^a   Lettieri, S ^a   Maddalena, P ^a   Vitiello, R ^a   Di Francia, G ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b ENEA CR Portici   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DATA REDUCTION; LIGHT TRANSMISSION; MODULATION; NUMERICAL METHODS; OPTICAL DEVICES; POROSITY; PUMPING (LASER); REFRACTIVE INDEX; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL VARIABLES MEASUREMENT; THIN FILMS;

HEAT PROPAGATION EQUATION; OPTICAL PUMP PROBE METHOD; THIN FILM CHARACTERIZATION; TRANSIENT HEATING;

POROUS SILICON;

EID: 0034832562     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/13/5/327     Document Type: Article

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