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Volumn 68, Issue 11, 1997, Pages 4180-4183
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Traveling wave method for measurement of thermal conductivity of thin films
a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
CALCULATIONS;
COPPER;
GLASS;
HELIUM NEON LASERS;
LASER BEAM EFFECTS;
METALLIC FILMS;
SILICON;
THERMAL DIFFUSION IN SOLIDS;
THIN FILMS;
PHASE LAG;
THERMAL CONDUCTIVITY MEASUREMENT;
THERMAL DIFFUSIVITY;
TRAVELING WAVE;
THERMAL CONDUCTIVITY OF SOLIDS;
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EID: 0031276605
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1148364 Document Type: Article |
Times cited : (32)
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References (15)
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