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Journal of Crystal Growth

Volumn 308, Issue 2, 2007, Pages 424-429

Thickness-dependent dielectric properties of nanoscale Pt/(Pb,Ba)ZrO3/BaPbO3 capacitors

(2) Wu, Lin Jung a Wu, Jenn Ming a

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

A1. Crystal structure; A1. Diffusion; A1. Interfaces; B2. Ferroelectric materials

Indexed keywords

CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; DIFFUSION; FERROELECTRIC MATERIALS; FILM THICKNESS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETRON SPUTTERING; THIN FILMS;

ANTIFERROELECTRIC LAYER; DEAD LAYER; LEAD BARIUM ZIRCONATE (PBZ) THIN FILMS; RF-MAGNETRON SPUTTERING;

CAPACITORS;

EID: 35348911873 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2007.08.029 Document Type: Article

Times cited : (7)

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