Microstructure dependence of electrical properties of (Ba0.5Sr0.5)TiO3 thin films deposited on Pt/SiO2/Si

Journal of Applied Physics

Volumn 80, Issue 10, 1996, Pages 5891-5894

  Lee, Won Jae ^a   Kim, Ho Gi ^a   Yoon, Soon Gil ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Chungnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001057596     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363583     Document Type: Review

References (11)

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