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Volumn 76, Issue 15, 2007, Pages

Epitaxial phase of hafnium dioxide for ultrascaled electronics

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Indexed keywords


EID: 35148867434     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.155405     Document Type: Article
Times cited : (13)

References (34)
  • 18
    • 51149210200 scopus 로고
    • See, for instance, RMPHAT 0034-6861 10.1103/RevModPhys.61.689
    • See, for instance, R. O. Jones and O. Gunnarson, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.61.689 61, 689 (1989), and references therein.
    • (1989) Rev. Mod. Phys. , vol.61 , pp. 689
    • Jones, R.O.1    Gunnarson, O.2
  • 19
    • 26144450583 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.23.5048
    • J. P. Perdew and A. Zunger, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.23.5048 23, 5048 (1981).
    • (1981) Phys. Rev. B , vol.23 , pp. 5048
    • Perdew, J.P.1    Zunger, A.2
  • 21
    • 0001161603 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.48.1425
    • L. Kleinman and D. M. Bylander, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.48.1425 48, 1425 (1982).
    • (1982) Phys. Rev. Lett. , vol.48 , pp. 1425
    • Kleinman, L.1    Bylander, D.M.2
  • 24
    • 1842816907 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.13.5188
    • H. J. Monkhorst and J. D. Pack, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.13.5188 13, 5188 (1976).
    • (1976) Phys. Rev. B , vol.13 , pp. 5188
    • Monkhorst, H.J.1    Pack, J.D.2
  • 25
    • 0037096520 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.65.233106
    • X. Zhao and D. Vanderbilt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.233106 65, 233106 (2002).
    • (2002) Phys. Rev. B , vol.65 , pp. 233106
    • Zhao, X.1    Vanderbilt, D.2
  • 29
    • 33846117551 scopus 로고    scopus 로고
    • Ultrasoft pseudopotentials and other technicalities are the same used to study fluorite and baddeleyite Hf O2, in MSSPFQ 1369-8001
    • Ultrasoft pseudopotentials and other technicalities are the same used to study fluorite and baddeleyite Hf O2, in A. Debernardi and M. Fanciulli, Mater. Sci. Semicond. Process. MSSPFQ 1369-8001 9, 1014-1019 (2006).
    • (2006) Mater. Sci. Semicond. Process. , vol.9 , pp. 1014-1019
    • Debernardi, A.1    Fanciulli, M.2
  • 32
    • 0018918634 scopus 로고
    • JPCSAW 0022-3697 10.1016/0022-3697(80)90205-X
    • L. G. Liu, J. Phys. Chem. Solids JPCSAW 0022-3697 10.1016/0022-3697(80) 90205-X 41, 331 (1980).
    • (1980) J. Phys. Chem. Solids , vol.41 , pp. 331
    • Liu, L.G.1
  • 34
    • 4243672394 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.89.266101
    • V. Fiorentini and G. Gulleri, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.89.266101 89, 266101 (2002).
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 266101
    • Fiorentini, V.1    Gulleri, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.