Profiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution

Science

Volumn 303, Issue 5659, 2004, Pages 816-818

  Lyeo, Ho Ki ^a   Khajetoorians, A A ^a   Shi, Li ^b   Pipe, Kevin P ^c   Ram, Rajeev J ^c   Shakouri, Ali ^d   Shih, C K ^a,b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b The University of Texas at Austin   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d University of California Santa Cruz   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; SEMICONDUCTOR JUNCTIONS;

THERMOELECTRIC MICROSCOPY;

THERMOELECTRICITY;

NANOPARTICLE;

MICROSCOPY;

ARTICLE; CORRELATION ANALYSIS; ELECTRIC POTENTIAL; OPTICS; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; TEMPERATURE DEPENDENCE; THERMAL CONDUCTIVITY; VACUUM;

EID: 0842331452     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1091600     Document Type: Article

References (22)

1. G. Mahan, B. Sales, J. Sharp, Phys. Today 50, 42 (1997).
2. F. J. DiSalvo, Science 285, 703 (1999).
3. H. Edwards, Q. Niu, A. de Lozanne, in Wiley Encyclopedia of Electrical and Electronics Engineering, J. G. Webster, Ed. (Wiley, New York, 1999), vol. 22, pp. 80-90.
4. L. D. Hicks, M. S. Dresselhaus, Phys. Rev. B 47, 12727 (1993).
5. L. D. Hicks, M. S. Dressethaus, Phys. Rev. B 47, 16631 (1993).
6. R. Venhatasubramanian, E. Siivola, T. Colpitts, B. O'Quinn, Nature 413, 597 (2001).
7. T. C. Harman, P. J. Taylor, M. P. Walsh, B. E. LaForge, Science 297, 2229 (2002).
8. P. de Wolf, R. Stephenson, T. Trenkler, T. Hantschel, W. Vandervorst, J. Vac. Sci. Technol. B 18, 361 (2000).
9. C. C. Williams, H. K. Wickramasinghe, Nature 344, 317 (1990).
10. J. C. Poler, R. M. Zimmermann, E. C. Cox, Langmuir 11, 2689 (1995).
11. See supporting data on Science Online.
12. A. Vaterlaus, R. M. Feenstra, P. D. Kirchner, J. M. Woodall, G. D. Pettit, J. Vac. Sci. Technol. B 11, 1502 (1993).
13. A. R. Smith et al., J. Vac. Sci. Technol. B 12, 2610 (1994).
14. N. D. Jäger et al., Phys. Rev. B 67, 165307 (2003).
15. K. P. Pipe, R. J. Ram, A. Shakouri, Phys. Rev. B 66, 125316 (2002).
16. J. F. Bresse, A. C. Papadopoulo, J. Appl. Phys. 64, 98 (1988).
17. G. D. J. Smit, S. Rogge, T. M. Klapwilk, Appl. Phys. Lett. 81, 3852 (2002).
18. o < W.
19. R. Trzcinski, E. Gmelin, H. J. Queisser, Phys. Rev. Lett. 56, 1086 (1986).
20. O. I. Shktyareskii, A. G. M. Jansen, J. G. H. Hermsen, P. Wyder, Phys. Rev. Lett. 57, 1374 (1986).
21. L. Weber, M. Lehr, E. Gmelin, Phys. Rev. B 46, 9511 (1992).
22. Supported by NSF grants DMR-0210383, DMR-0306239, and CTS-0239179 and by the Texas Advanced Technology Program. L.S. thanks U. Ghoshal for helpful discussions on SThEM.