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Volumn 102, Issue 5, 2007, Pages

The intermixing and strain effects on electroluminescence of SiGe dots

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLUMINESCENCE; ENERGY DISPERSIVE SPECTROSCOPY; RAMAN SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON;

EID: 34548659570     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2777686     Document Type: Article
Times cited : (31)

References (27)
  • 3
    • 0003896332 scopus 로고    scopus 로고
    • Electronic Materials Series No. 6 edited by T. P.Pearsall (Wiley, Federal Republic of Germany
    • Quantum Semiconductor Devices and Technologies, Electronic Materials Series No. 6 edited by, T. P. Pearsall, (Wiley, Federal Republic of Germany, 2000).
    • (2000) Quantum Semiconductor Devices and Technologies
  • 19
    • 34548651541 scopus 로고
    • EMIS Datareviews Series No. 12, edited by E.Kasper (INSPEC, London
    • Silicon Germanium, EMIS Datareviews Series No. 12, edited by, E. Kasper, (INSPEC, London, 1995), p. 127.
    • (1995) Silicon Germanium , pp. 127
  • 25
    • 0003760432 scopus 로고    scopus 로고
    • EMIS Datareviews Series No. 20, edited by R.Hull (INSPEC, London
    • Properties of Crystalline Silicon, EMIS Datareviews Series No. 20, edited by, R. Hull, (INSPEC, London, 1999).
    • (1999) Properties of Crystalline Silicon


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.