Raman characterization of strain and composition in small-sized self-assembled Si/Ge dots

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 12, 2003, Pages

  Tan, H ^a   Brunner, K ^a   Bougeard, D ^a   Abstreiter, G ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; CHEMICAL STRUCTURE; CORRELATION ANALYSIS; MOLECULAR INTERACTION; MOLECULAR SIZE; PHYSICS; RAMAN SPECTROMETRY; STRESS STRAIN RELATIONSHIP; STRUCTURE ANALYSIS;

EID: 0242440207     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.125302     Document Type: Article

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