Local conductance imaging of semiconductor nanowires on an insulative substrate using an integrated nanogap probe

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 8 B, 2007, Pages 5639-5642

  Nagase, Masao ^a   Yamaguchi, Hiroshi ^a  

^a Bio Medical Informatics Research Center   (Japan)

Author keywords

Focused ion beam; GaAs; InAs; Local conductance; Multiprobe; Nanogap; Nanotechnology; Scanning probe microscopy

Indexed keywords

ELECTRODES; FOCUSED ION BEAMS; SCANNING PROBE MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR MATERIALS;

FOCUSED ION BEAM; LOCAL CONDUCTANCE;

NANOWIRES;

EID: 34548290958     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.5639     Document Type: Article

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