Nanoporous structure of a GdF3 thin film evaluated by variable angle spectroscopic ellipsometry

Applied Optics

Volumn 46, Issue 16, 2007, Pages 3221-3226

  Wang, Jue ^a   Maier, Robert ^a   Dewa, Paul G ^a   Schreiber, Horst ^a   Bellman, Robert A ^a   Elli, David Dawson ^a  

^a Corning Tropel Corporation ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; LASER OPTICS; OPTICAL LOSSES; SURFACE ROUGHNESS; THIN FILMS;

ENVIRONMENTAL CONTAMINATION; NANOPOROUS STRUCTURE; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

GADOLINIUM COMPOUNDS;

EID: 34547350710     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.003221     Document Type: Article

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