Nanoscale surface characterization of GaN nanowires correlated with metal contact characteristics

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 4, 2007, Pages 1123-1129

  Koley, G ^a   Lakshmanan, L ^a   Wu, H ^b   Cha, Ho Young ^b  

^a University of South Carolina   (United States)

^b Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRAPPING; METAL CONTACT CHARACTERISTICS; SCANNING GATE MICROSCOPY; SURFACE BARRIER;

ELECTRONIC PROPERTIES; NANOWIRES; OHMIC CONTACTS; SCANNING PROBE MICROSCOPY; SILICA;

GALLIUM NITRIDE;

EID: 34547149040     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200622516     Document Type: Conference Paper

References (18)

1. Y. Huang, X. Duan, Y. Cui, and C. M. Lieber, Nano Lett. 2, 101 (2002).
2. J. Kim, H. M. So, J. W. Park, J. J. Kim, J. Kim, C. J. Lee, and S. C. Lyu, Appl. Phys. Lett. 80, 3548 (2002).
3. H. Choi, J. C. Johnson, R. He, S. Lee, F. Kim, P. Pauzauskie, J. Goldberger, R. J. Saykally, and P. Yang, J. Phys. Chem. B 107, 8721 (2003).
4. F. Qian, Y. Li, S. Gradecak, D. Wang, C. J. Barrelet, and C. M. Lieber, Nano Lett. 4, 1975 (2004).
5. B. S. Simpkins, P. E. Pehrsson, and A. R. Laracuente, Appl. Phys. Lett. 88, 072111 (2006).
6. H. Cha, H. Wu, Mvs Chandrashekhar, Y. C. Choi, S. Chae, G. Koley, and M. G. Spencer, Nanotechnology 17, 1264 (2006).
7. G. Koley, V. Tilak, L. F. Eastman, and M. G. Spencer, IEEE Trans. Electron Devices 50, 886 (2003).
8. Jae Kim, H. Oh, H. So, Ju Kim, Jinhee Kim, C. Lee, and S. Lyu, Nanotechnology 13, 701 (2002).
9. Z. Zhong, F. Qian, D. Wang, and C. M. Lieber, Nano Lett. 3, 343 (2006).
10. J. Liu, X. Meng, Y. Jiang, C. Lee, I. Bello, and S. Lee, Appl. Phys. Lett. 83, 4241 (2003).
11. Y. Li, J. Xiang, F. Qian, S. Gradecak, Y. Wu, H. Yan, D. A. Blom, and C.M. Lieber, Nano Lett. 6, 1468 (2006).
12. P. Avouris, J. Appenzeller, R. Martel, and S. J. Wind, Proc. IEEE 91, 1772 (2003).
13. P. L. McEuen, M. S. Fuhrer, and H. Park, IEEE Trans. Nanotechnol. 1, 78 (2002).
14. T. Tombler, C. Zhou, L. Alexeseyev, J. Kong, H. Dai, L. Liu, C. S. Jayanthi, M. Tang, and S. Wu, Nature 405, 769 (2000).
15. G. Koley and M. G. Spencer, Appl. Phys. Lett. 78, 2873 (2001).
16. H. Wu, H. Cha, M. Chandrashekhar, M. G. Spencer, and G. Koley, J. Electron. Mater. 35, 670 (2006).
17. Please refer to diamond doped probes at https://www.veecoprobes.com/
18. S. M. Sze, Physics of semiconductor devices (John Wiley & Sons, 1981), p. 77.