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Volumn 4, Issue SUPPL. 1, 1999, Pages

Fast lateral epitaxial overgrowth of gallium nitride by metalorganic chemical vapor deposition using a two-step process

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; GALLIUM NITRIDE; HIGH TEMPERATURE EFFECTS; METALLORGANIC VAPOR PHASE EPITAXY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; THIN FILMS;

EID: 3442890993     PISSN: 10925783     EISSN: None     Source Type: Journal    
DOI: 10.1557/s109257830000288x     Document Type: Conference Paper
Times cited : (8)

References (25)
  • 20
    • 3442892475 scopus 로고    scopus 로고
    • note
    • The fill factor (FF) is defined as the ratio of the stripe opening width to the pattern period, such that an infinitely wide mask corresponds to FF=0 and a planar GaN film corresponds to FF=1.
  • 24
    • 3442901737 scopus 로고    scopus 로고
    • Selective-area PL measurements on LEO GaN and InGaN are reported in Ref. 9
    • Selective-area PL measurements on LEO GaN and InGaN are reported in Ref. 9.
  • 25
    • 3442892761 scopus 로고    scopus 로고
    • P.T. Fini, unpublished results
    • P.T. Fini, unpublished results.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.