Characterization of growth defects in thin GaN layers with X-ray microbeam

Physica Status Solidi (B) Basic Research

Volumn 244, Issue 5, 2007, Pages 1735-1742

  Barabash, R I ^a   Ice, G E ^a   Roder, C ^b   Budai, J ^a   Liu, W ^c   Figge, S ^b   Einfeldt, S ^b,e   Hommel, D ^b   Davis, R F ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF BREMEN   (Germany)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d North Carolina State University   (United States)

^e LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34249014878     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200675113     Document Type: Article

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