-
1
-
-
34248540944
-
-
Link to ITRS 2005: .
-
-
-
-
3
-
-
33845426952
-
Two-dimensional quantum mechanical modeling of nanotransistors
-
Svizhenko A., Anantram M.P., Govindan T.R., Biegle B., and Venugopal R. Two-dimensional quantum mechanical modeling of nanotransistors. J Appl Phys 91 (2002) 2343-2354
-
(2002)
J Appl Phys
, vol.91
, pp. 2343-2354
-
-
Svizhenko, A.1
Anantram, M.P.2
Govindan, T.R.3
Biegle, B.4
Venugopal, R.5
-
5
-
-
18644369368
-
Simulating quantum transport in nanoscale transistors: real versus mode-space approaches
-
Venugopal R., Ren Z., Datta S., and Lundstrom M.S. Simulating quantum transport in nanoscale transistors: real versus mode-space approaches. J Appl Phys 92 (2002) 3730-3739
-
(2002)
J Appl Phys
, vol.92
, pp. 3730-3739
-
-
Venugopal, R.1
Ren, Z.2
Datta, S.3
Lundstrom, M.S.4
-
6
-
-
0037648693
-
A simple quantum mechanical treatment of scattering in nanoscale transistors
-
Venugopal R., Paulsson M., Datta S., and Lundstrom M.S. A simple quantum mechanical treatment of scattering in nanoscale transistors. J Appl Phys 93 (2003) 5613-5625
-
(2003)
J Appl Phys
, vol.93
, pp. 5613-5625
-
-
Venugopal, R.1
Paulsson, M.2
Datta, S.3
Lundstrom, M.S.4
-
7
-
-
0041910831
-
NanoMOS 25: a two-dimensional simulator for quantum transport in double-gate MOSFETs
-
Ren Z., Venugopal R., Goasguen S., Datta S., and Lundstrom. NanoMOS 25: a two-dimensional simulator for quantum transport in double-gate MOSFETs. IEEE Trans Electr Dev 50 (2003) 1914-1925
-
(2003)
IEEE Trans Electr Dev
, vol.50
, pp. 1914-1925
-
-
Ren, Z.1
Venugopal, R.2
Goasguen, S.3
Datta, S.4
Lundstrom5
-
8
-
-
1442311911
-
Device design and manufacturing issues for 10 nm-scale MOSFETs: a computational study
-
Hassan S., Wang J., and Lundstrom M.S. Device design and manufacturing issues for 10 nm-scale MOSFETs: a computational study. Solid-State Electron 48 (2004) 867-875
-
(2004)
Solid-State Electron
, vol.48
, pp. 867-875
-
-
Hassan, S.1
Wang, J.2
Lundstrom, M.S.3
-
10
-
-
0442311241
-
A numerical study of scaling issues for Schottky barrier carbon nanotube transistors
-
Guo J., Datta S., and Lundstrom M.S. A numerical study of scaling issues for Schottky barrier carbon nanotube transistors. IEEE Trans Electr Dev 51 (2004) 172-177
-
(2004)
IEEE Trans Electr Dev
, vol.51
, pp. 172-177
-
-
Guo, J.1
Datta, S.2
Lundstrom, M.S.3
-
11
-
-
33745514807
-
Current-voltage characteristics of molecular conductors: two versus and three terminal
-
Damle P., Rakshit T., Paulsson M., and Datta S. Current-voltage characteristics of molecular conductors: two versus and three terminal. IEEE Trans Nanotechnol 1 (2002) 145-153
-
(2002)
IEEE Trans Nanotechnol
, vol.1
, pp. 145-153
-
-
Damle, P.1
Rakshit, T.2
Paulsson, M.3
Datta, S.4
-
12
-
-
0035388345
-
Fully quantum-mechanical modeling of tunneling current in ultrathin gate oxide metal-oxide-semiconductor devices
-
Iwata H. Fully quantum-mechanical modeling of tunneling current in ultrathin gate oxide metal-oxide-semiconductor devices. Jpn J Appl Phys 40 (2001) 4496-4500
-
(2001)
Jpn J Appl Phys
, vol.40
, pp. 4496-4500
-
-
Iwata, H.1
-
13
-
-
9144259738
-
Impact of image and exchange-correlation effects on ballistic electron transport in nanoscale double-gate metal-oxide-semiconductor transistors
-
Iwata H., Matsuda T., and Ohzone T. Impact of image and exchange-correlation effects on ballistic electron transport in nanoscale double-gate metal-oxide-semiconductor transistors. Jpn J Appl Phys 43 (2004) L1205-L1207
-
(2004)
Jpn J Appl Phys
, vol.43
-
-
Iwata, H.1
Matsuda, T.2
Ohzone, T.3
-
14
-
-
23944491953
-
Influence of image and exchange-correlation effects on electron transport in nanoscale DG MOSFETs
-
Iwata H., Matsuda T., and Ohzone T. Influence of image and exchange-correlation effects on electron transport in nanoscale DG MOSFETs. IEEE Trans Electr Dev 52 (2005) 1596-1602
-
(2005)
IEEE Trans Electr Dev
, vol.52
, pp. 1596-1602
-
-
Iwata, H.1
Matsuda, T.2
Ohzone, T.3
-
15
-
-
0036494049
-
A compact scattering model for the nanoscale double-gate MOSFET
-
Rahman A., and Lundstrom M.S. A compact scattering model for the nanoscale double-gate MOSFET. IEEE Trans Electr Dev 49 (2003) 481-489
-
(2003)
IEEE Trans Electr Dev
, vol.49
, pp. 481-489
-
-
Rahman, A.1
Lundstrom, M.S.2
-
16
-
-
0000741169
-
Comparative study of phonon-limited mobility of two-dimensional electrons in strained and unstrained Si metal-oxide-semiconductor field-effect transistors
-
Takagi S., Hoyt J.L., Welser J.J., and Gibbons J.F. Comparative study of phonon-limited mobility of two-dimensional electrons in strained and unstrained Si metal-oxide-semiconductor field-effect transistors. J Appl Phys 80 (1996) 1567-1577
-
(1996)
J Appl Phys
, vol.80
, pp. 1567-1577
-
-
Takagi, S.1
Hoyt, J.L.2
Welser, J.J.3
Gibbons, J.F.4
-
17
-
-
0043028324
-
Modeling of electron mobility degradation by remote Coulomb scattering in ultrathin oxide MOSFETs
-
Esseni D., and Abramo A. Modeling of electron mobility degradation by remote Coulomb scattering in ultrathin oxide MOSFETs. IEEE Trans Electr Dev 50 (2003) 1665-1674
-
(2003)
IEEE Trans Electr Dev
, vol.50
, pp. 1665-1674
-
-
Esseni, D.1
Abramo, A.2
-
18
-
-
0348239733
-
Study of interface roughness dependence of electron mobility in Si inversion layer using Monte Carlo method
-
Yamakawa S., Ueno H., Taniguchi K., Hamaguchi C., Miyatsuji K., Masaki K., et al. Study of interface roughness dependence of electron mobility in Si inversion layer using Monte Carlo method. J Appl Phys 79 (1996) 911-916
-
(1996)
J Appl Phys
, vol.79
, pp. 911-916
-
-
Yamakawa, S.1
Ueno, H.2
Taniguchi, K.3
Hamaguchi, C.4
Miyatsuji, K.5
Masaki, K.6
-
19
-
-
33747119398
-
On the performance limits for Si MOSFET's: a theoretical study
-
Assad F., Ren Z., Vasileska D., Datta S., and Lundstrum M. On the performance limits for Si MOSFET's: a theoretical study. IEEE Trans Electr Dev 47 (2000) 232-240
-
(2000)
IEEE Trans Electr Dev
, vol.47
, pp. 232-240
-
-
Assad, F.1
Ren, Z.2
Vasileska, D.3
Datta, S.4
Lundstrum, M.5
|