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Volumn 101, Issue 8, 2007, Pages

One-dimensional analysis of the rate of plasma-assisted sputter deposition

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CATHODES; FILM GROWTH; GERMANIUM; SILICON; TANTALUM; TUNGSTEN;

EID: 34247572519     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2720257     Document Type: Conference Paper
Times cited : (38)

References (21)
  • 2
    • 13844309319 scopus 로고    scopus 로고
    • 0040-6090 10.1016/j.tsf.2004.10.051
    • S. Berg and T. Nyberg, Thin Solid Films 0040-6090 10.1016/j.tsf.2004.10. 051 476, 215 (2005).
    • (2005) Thin Solid Films , vol.476 , pp. 215
    • Berg, S.1    Nyberg, T.2
  • 7
  • 14
    • 0002312302 scopus 로고
    • 0040-6090 10.1016/0040-6090(78)90273-0
    • J. A. Thornton, Thin Solid Films 0040-6090 10.1016/0040-6090(78)90273-0 54, 23 (1978).
    • (1978) Thin Solid Films , vol.54 , pp. 23
    • Thornton, J.A.1
  • 15
    • 0021757221 scopus 로고
    • 0040-6090 10.1016/0040-6090(84)90160-3
    • J. A. Thornton and J. L. Lamb, Thin Solid Films 0040-6090 10.1016/0040-6090(84)90160-3 119, 87 (1984).
    • (1984) Thin Solid Films , vol.119 , pp. 87
    • Thornton, J.A.1    Lamb, J.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.