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Volumn 22, Issue 2, 2007, Pages 15-19

Optimization of RF plasma sources for the MBE growth of nitride and dilute nitride semiconductor material

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FLOW RATE; IDENTIFICATION (CONTROL SYSTEMS); MOLECULAR BEAM EPITAXY; SEMICONDUCTOR MATERIALS;

EID: 34247261060     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/22/2/003     Document Type: Article
Times cited : (15)

References (15)
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    • Ion damage effects from negative deflector plate voltages during the plasma-assisted molecular-beam epitaxy growth of dilute nitrides
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  • 2
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    • Rf-plasma source qualification and compositional characterisation of GaNAs superlattices using SIMS
    • Mulcahy C P A et al 2006 Rf-plasma source qualification and compositional characterisation of GaNAs superlattices using SIMS Appl. Surf. Sci. 252 7218-20
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  • 6
    • 0036724144 scopus 로고    scopus 로고
    • Use of optical emission intensity to characterize an RF plasma source for MBE growth of GaAsN
    • Reifsnider J M et al 2002 Use of optical emission intensity to characterize an RF plasma source for MBE growth of GaAsN J. Cryst. Growth 243 396-403
    • (2002) J. Cryst. Growth , vol.243 , Issue.3-4 , pp. 396-403
    • Reifsnider, J.M.1    Al, E.2
  • 7
    • 31144435429 scopus 로고    scopus 로고
    • RF plasma sources for III-nitrides growth: Influence of operating conditions and device geometry on active species production and InN film properties
    • Anderson P A et al 2006 RF plasma sources for III-nitrides growth: influence of operating conditions and device geometry on active species production and InN film properties Phys. Stat. Solidi a 203 106-11
    • (2006) Phys. Stat. Solidi , vol.203 , Issue.1 , pp. 106-111
    • Anderson, P.A.1    Al, E.2
  • 8
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    • Using beam flux monitor as Langmuir probe for plasma-assisted molecular beam epitaxy
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  • 9
    • 31144473875 scopus 로고    scopus 로고
    • Protecting wafer surface during plasma ignition using an arsenic cap
    • Wistey M A et al 2005 Protecting wafer surface during plasma ignition using an arsenic cap J. Vac. Sci. Technol. B 23 1324-7
    • (2005) J. Vac. Sci. Technol. , vol.23 , Issue.3 , pp. 1324-1327
    • Wistey, M.A.1    Al, E.2
  • 10
    • 18444388311 scopus 로고    scopus 로고
    • Nitrogen plasma optimization for high-quality dilute nitrides
    • Wistey M A et al 2005 Nitrogen plasma optimization for high-quality dilute nitrides J. Cryst. Growth 278 229-33
    • (2005) J. Cryst. Growth , vol.278 , Issue.1-4 , pp. 229-233
    • Wistey, M.A.1    Al, E.2
  • 11
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    • Nitrogen species from radio frequency plasma sources used for molecular beam epitaxy growth of GaN
    • Blant A V et al 2000 Nitrogen species from radio frequency plasma sources used for molecular beam epitaxy growth of GaN Plasma Sources Sci. Technol. 9 12-7
    • (2000) Plasma Sources Sci. Technol. , vol.9 , Issue.1 , pp. 12-17
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  • 12
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    • Foxon C T 2005 Private communication
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  • 13
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    • Molecular beam epitaxial growth window for high-quality (Ga,In)(N,As) quantum wells for long wavelength emission
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  • 14
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  • 15
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.