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Volumn 55, Issue 12, 2006, Pages 1630-1639

Opens and delay faults in CMOS RAM address decoders

Author keywords

Address decoder delay faults; Addressing methods; BIST; DFT; Memory testing; Open defects

Indexed keywords

ADDRESS DECODER DELAY FAULTS; ADDRESSING METHODS; MEMORY TESTING; OPEN DEFECTS;

EID: 33947241222     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2006.203     Document Type: Article
Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.