Comparison of open and resistive-open defect test conditions in SRAM address decoders

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 250-255

  Dilillo, L ^a   Girard, P ^a   Pravossoudovitch, S ^a   Virazel, A ^a   Borri, S ^b  

^a LIRMM   (France)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DECODING;

ADDRESS DECODERS; COMPARATIVE ANALYSIS; EMBEDDED SRAMS; HARD-TO-DETECT FAULTS; OPEN FAULTS; PARALLEL PLANES; RESISTIVE-OPEN DEFECTS; TEST CONDITION;

DEFECTS;

EID: 3142748931     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250818     Document Type: Conference Paper

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