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Journal of Applied Physics

Volumn 101, Issue 4, 2007, Pages

Dynamic characterization of nanoelectromechanical oscillators by atomic force microscopy

(4) Ilic, B a Krylov, S b Bellan, L M a Craighead, H G a

a Department of Molecular Biology and Genetics (United States)

b TEL AVIV UNIVERSITY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON RESONANCE; MATHEMATICAL MODELS; MICROMECHANICS; NANOSTRUCTURED MATERIALS; PIEZOELECTRIC TRANSDUCERS;

DERJAGUIN MULLER TOPOROV MODEL; NANOELECTROMECHANICAL OSCILLATORS; NANOMECHANICAL STRUCTURES; NANOSCALE STRUCTURES;

OSCILLATORS (ELECTRONIC);

EID: 33847678953 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2472277 Document Type: Article

Times cited : (23)

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