메뉴 건너뛰기




Volumn 77, Issue 12, 2000, Pages 1792-1794

Characterizing mechanical resonators by means of a scanning acoustic force microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001154586     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1311317     Document Type: Article
Times cited : (11)

References (23)
  • 10
    • 0043050884 scopus 로고
    • Nanjing, China, edited by Y. Wei and B. Gu Plenum, New York
    • A. Kulik, J. Attal, and G. Gremaud, in Acoustical Imaging, Nanjing, China, edited by Y. Wei and B. Gu (Plenum, New York, 1992), Vol. 20.
    • (1992) Acoustical Imaging , vol.20
    • Kulik, A.1    Attal, J.2    Gremaud, G.3
  • 22
    • 85007624354 scopus 로고    scopus 로고
    • French Patent No. 7,802,261 (1978)
    • R. J. Besson, French Patent No. 7,802,261 (1978).
    • Besson, R.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.