Analysis of error-masking and X-masking probabilities for convolutional compactors

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 561-570

  Arai, Masayuki ^a   Fukumoto, Satoshi ^a   Iwasaki, Kazuhiko ^a  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY CODES; COMPUTER SIMULATION; ERROR ANALYSIS; MONTE CARLO METHODS; PROBABILITY; TREES (MATHEMATICS);

COMPACTING TEST; CONVOLUTIONAL COMPACTORS; ERROR MASKING; X-MASKING PROBABILITY;

CONVOLUTIONAL CODES;

EID: 33847123495     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584017     Document Type: Conference Paper

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