ScanBist: A Multifrequency Scan-Based BIST Method

IEEE Design & Test of Computers

Volumn 11, Issue 1, 1994, Pages 7-17

  Nadeau Dostie, Benoit ^a   Burek, Dwayne ^a   Hassan, Abu S M ^a  

^a NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; DIGITAL DEVICES; EQUIPMENT TESTING; SYNCHRONIZATION;

BUILT-IN SELF TEST; SCANBIST;

AUTOMATIC TESTING;

EID: 0028400628     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.262318     Document Type: Article

References (18)

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