STARBIST: scan autocorrelated random pattern generation

Proceedings - Design Automation Conference

Volumn , Issue , 1997, Pages 472-477

  Tsai, K H ^a   Hellebrand, S ^a   Rajski, J ^a   Marek Sadowska, M ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA STORAGE EQUIPMENT; LOGIC CIRCUITS; SHIFT REGISTERS;

LINEAR FEEDBACK SHIFT REGISTER; MULTIPLE INPUT SHIFT REGISTER; READ ONLY MEMORY; SCAN BASED BUILT IN SELF TEST;

COMPUTER HARDWARE;

EID: 0030686702     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)